Microscopic Characterization

Overview
Microscopic methods play an essential role in nanomaterials characterization. Microscopic and X-ray based characterization of nanomaterials techniques are used for the determination of surface morphology and dispersion characteristics of nanomaterials. This course deals with details of these aspects, and will provide a fundamental understanding of morphological tools, such as instrumentation, sample preparation and different kinds of analyses, etc.


Course Specification

Language English
Category General
Difficulty Level Normal
Audience Level General
Duration 12:19:18
Effort 2 ~ 3 Hours Per Week
Description Microscopic characterization methods refer to scientific techniques Which allow determination of both composition and structure of a material. Optical microscopy, scanning probe microscopy and electron microscopy are known as microscopic techniques. This course illustrates how microscopic characterization techniques are used.

Section 1



Imaging of the materials 06:46
Optical microscope 12:22
The use of electron beam for imaging application 09:11
The basic functions of imaging with electron beam 01 14:17
The basic functions of imaging with electron beam 02 13:24
Interaction of electron beam with sample 15:54

Section 2



Imaging techniques with transmission electron microscopy 17:29
Operating conditions of TEM 14:26
High resolution TEM (HR-TEM) and scanning TEM (STEM) 11:58

Section 3



Back-scattered electron imaging 16:40
Scanning electron microscope imaging 10:24
Important points about electron microscopy (EM) 13:16

Section 4



Elemental analysis using Electron Microscopes 21:01

Section 5



Imaging using scanning probe microscopes (SPM) 11:53
Scanning Tunneling Microscope (STM) 18:14
Piezoelectric materials 11:34
Imaging modes: constant current 09:06
Importance of sharp tip for STM imaging 11:23
Advantages and Limitation of STM microscope 11:22

Section 6



Atomic Force Microscope (AFM) 11:42
Imaging using atomic force 10:41
Advantages and disadvantages of AFM microscope 12:49
Semi-contact (tapping) mode 11:01
Non-contact Mode 17:26
MFM 11:14

Section 7



What is crystalline and Amorphous Material? 14:07
Diffraction and Wave interference 13:52
Wave diffraction in crystalline solids 18:02
X-ray diffraction 19:57
Main part of XRD machine 21:26
X-ray fluorescence 12:02
Determination of crystal structure of sample 15:30
Study of the phase Composition of a Sample 12:58
Calculation of Crystallite Size 16:01
The wavelength of electron 18:16
Electron diffraction using Transmission electron microscopy 14:18
Electron diffraction of real materials 12:02
Electron diffraction vs. X-ray diffraction 11:46

Section 8



Study of the surface chemistry of material using electron spectroscopy 18:55
X-ray photoelectron emission 11:43
X-ray photoelectron spectroscopy (XPS) 09:28
X-ray monochromator 17:36
X-ray photoelectron spectrometer 11:22
How to get the binding energy? 09:15
Which questions XPS can answer? 14:51
Spin-orbit splitting of XPS peaks 11:51
Elemental shift of XPS peaks 16:48
A real XPS analysis 11:57
Study of the surface chemistry of material by using Auger electrons 13:42
Kinetic energy of Auger electrons 15:59
Auger electron spectrometer 1 12:12
Auger electron spectrometer 2 13:04
Auger electron spectroscopy 15:41
Auger electrons vs XPS spectra 09:04