Semi-contact (tapping) mode

Microscopic Characterization
Category General
Difficulty Level Normal
Audience Level General
Description Microscopic characterization methods refer to scientific techniques Which allow determination of both composition and structure of a material. Optical microscopy, scanning probe microscopy and electron microscopy are known as microscopic techniques. This course illustrates how microscopic characterization techniques are used.
Overview
Microscopic methods play an essential role in nanomaterials characterization. Microscopic and X-ray based characterization of nanomaterials techniques are used for the determination of surface morphology and dispersion characteristics of nanomaterials. This course deals with details of these aspects, and will provide a fundamental understanding of morphological tools, such as instrumentation, sample preparation and different kinds of analyses, etc.


Booklet
Description
 In semi-contact or dynamic force or tapping mode, the tip periodically touches or taps the surface of sample. It happens with the aid of a piezoelectric crystal that causes the cantilever to oscillate in a vertical direction near its resonance frequency.
Mental Challenge
 Why contact mode imaging process in AFM improved to semi-contact mode?
Quizzes and Activities
 Activity: Make a list of the advantages of semi contact (tapping) imaging
Further Reading Sources

1. https://www.brighthubengineering.com/manufacturing-technology/95102-atomic-force-microscopy-afm-contact-non-contact-and-semi-contact-modes/ 

2. https://www.sciencedirect.com/topics/engineering/tapping-mode 

Section 1

Section 2

Section 3

Section 4

Section 5

Section 6

Section 7

Section 8