High resolution TEM (HR-TEM) and scanning TEM (STEM)
Category General
Difficulty Level Normal
Audience Level General
Description Microscopic characterization methods refer to scientific techniques Which allow determination of both composition and structure of a material. Optical microscopy, scanning probe microscopy and electron microscopy are known as microscopic techniques. This course illustrates how microscopic characterization techniques are used.
Difficulty Level Normal
Audience Level General
Description Microscopic characterization methods refer to scientific techniques Which allow determination of both composition and structure of a material. Optical microscopy, scanning probe microscopy and electron microscopy are known as microscopic techniques. This course illustrates how microscopic characterization techniques are used.
Overview
Microscopic methods play an essential role in nanomaterials characterization. Microscopic and X-ray based characterization of nanomaterials techniques are used for the determination of surface morphology and dispersion characteristics of nanomaterials. This course deals with details of these aspects, and will provide a fundamental understanding of morphological tools, such as instrumentation, sample preparation and different kinds of analyses, etc.
Booklet
Microscopic methods play an essential role in nanomaterials characterization. Microscopic and X-ray based characterization of nanomaterials techniques are used for the determination of surface morphology and dispersion characteristics of nanomaterials. This course deals with details of these aspects, and will provide a fundamental understanding of morphological tools, such as instrumentation, sample preparation and different kinds of analyses, etc.
Booklet
Description |
High resolution TEM (HR-TEM) is a type of electron microscopy specifically designed for samples with very fine thickness. The light field images obtained from HR-TEM demonstrate important information about the plane-by-plane atom assembly and the location of the atoms. Scanning TEM has the feasibility of using three types of electrons, including no deviation, low deviation and high deviation. Among these electrons high deviated electrons can produce images which give more information about the elements of the material. |
Mental Challenge |
What was the main reason for modification of TEM to STEM? |
Quizzes and Activities |
Activity: Explore the similarities and differences between images obtained from TEM, HR-TEM, and STEM. |
Further Reading Sources |
1. https://www.ncbi.nlm.nih.gov/pmc/articles/PMC2857930/ |
| Imaging techniques with transmission electron microscopy | 17:29 | |
| Operating conditions of TEM | 14:26 | |
| High resolution TEM (HR-TEM) and scanning TEM (STEM) | 11:58 |
| Atomic Force Microscope (AFM) | 11:42 | |
| Imaging using atomic force | 10:41 | |
| Advantages and disadvantages of AFM microscope | 12:49 | |
| Semi-contact (tapping) mode | 11:01 | |
| Non-contact Mode | 17:26 | |
| MFM | 11:14 |