Description |
NC-AFM measures surface topography by utilizing the attractive inter-atomic force between the tip and a sample surface. In order to realize NC-AFM in an ambient atmosphere, it is critical to maintain the tip-sample distance at a certain constant value and prevent tip from contacting sample surface. In non-contact mode, imaging of molecules can be done during the chemical reactions. |
Mental Challenge |
What is the difference between the imaging speeds of non-contact mode with semi-contact? |
Quizzes and Activities |
Activity: Sketch the imaging process in non-contact mode AFM. |
Further Reading Sources |
1. https://www.ntmdt-si.com/resources/spm-principles/atomic-force-microscopy/amplitude-modulation-afm/non-contact-mode |
| Atomic Force Microscope (AFM) | 11:42 | |
| Imaging using atomic force | 10:41 | |
| Advantages and disadvantages of AFM microscope | 12:49 | |
| Semi-contact (tapping) mode | 11:01 | |
| Non-contact Mode | 17:26 | |
| MFM | 11:14 |