Scanning electron microscope imaging
Category General
Difficulty Level Normal
Audience Level General
Description Microscopic characterization methods refer to scientific techniques Which allow determination of both composition and structure of a material. Optical microscopy, scanning probe microscopy and electron microscopy are known as microscopic techniques. This course illustrates how microscopic characterization techniques are used.
Difficulty Level Normal
Audience Level General
Description Microscopic characterization methods refer to scientific techniques Which allow determination of both composition and structure of a material. Optical microscopy, scanning probe microscopy and electron microscopy are known as microscopic techniques. This course illustrates how microscopic characterization techniques are used.
Overview
Microscopic methods play an essential role in nanomaterials characterization. Microscopic and X-ray based characterization of nanomaterials techniques are used for the determination of surface morphology and dispersion characteristics of nanomaterials. This course deals with details of these aspects, and will provide a fundamental understanding of morphological tools, such as instrumentation, sample preparation and different kinds of analyses, etc.
Booklet
Microscopic methods play an essential role in nanomaterials characterization. Microscopic and X-ray based characterization of nanomaterials techniques are used for the determination of surface morphology and dispersion characteristics of nanomaterials. This course deals with details of these aspects, and will provide a fundamental understanding of morphological tools, such as instrumentation, sample preparation and different kinds of analyses, etc.
Booklet
Description |
Based on the scattered electrons there are two different types of imaging with SEM. The secondary electrons are basically used for producing high quality images from the surface of materials. While back-scattered electrons are used for recognizing the elements and atomic number of samples. |
Mental Challenge |
What is the difference between the energy levels of electrons used for imaging in SEM? |
Quizzes and Activities |
Activity: Search and find different SEM images of a plant or an insect. |
Further Reading Sources |
1. https://onlinelibrary.wiley.com/doi/abs/10.1002/sca.4950170309 |
| Back-scattered electron imaging | 16:40 | |
| Scanning electron microscope imaging | 10:24 | |
| Important points about electron microscopy (EM) | 13:16 |
| Atomic Force Microscope (AFM) | 11:42 | |
| Imaging using atomic force | 10:41 | |
| Advantages and disadvantages of AFM microscope | 12:49 | |
| Semi-contact (tapping) mode | 11:01 | |
| Non-contact Mode | 17:26 | |
| MFM | 11:14 |