Wave diffraction in crystalline solids
Category General
Difficulty Level Normal
Audience Level General
Description Microscopic characterization methods refer to scientific techniques Which allow determination of both composition and structure of a material. Optical microscopy, scanning probe microscopy and electron microscopy are known as microscopic techniques. This course illustrates how microscopic characterization techniques are used.
Difficulty Level Normal
Audience Level General
Description Microscopic characterization methods refer to scientific techniques Which allow determination of both composition and structure of a material. Optical microscopy, scanning probe microscopy and electron microscopy are known as microscopic techniques. This course illustrates how microscopic characterization techniques are used.
Overview
Microscopic methods play an essential role in nanomaterials characterization. Microscopic and X-ray based characterization of nanomaterials techniques are used for the determination of surface morphology and dispersion characteristics of nanomaterials. This course deals with details of these aspects, and will provide a fundamental understanding of morphological tools, such as instrumentation, sample preparation and different kinds of analyses, etc.
Booklet
Microscopic methods play an essential role in nanomaterials characterization. Microscopic and X-ray based characterization of nanomaterials techniques are used for the determination of surface morphology and dispersion characteristics of nanomaterials. This course deals with details of these aspects, and will provide a fundamental understanding of morphological tools, such as instrumentation, sample preparation and different kinds of analyses, etc.
Booklet
Description |
The dark and light spots on a particular plane are the result of destructive and constructive interference, respectively. The resulting pattern is also called a diffraction pattern. The important information about the arrangement of atoms or molecules forming a crystalline can be obtained by the directions and the intensity of constructive diffraction in any particular direction. |
Mental Challenge |
How is possible to obtain information about the arrangement of atoms using diffraction pattern? |
Quizzes and Activities |
Activity: Describe the Bragg’s law and explain about its equation. |
Further Reading Sources |
1. http://electron6.phys.utk.edu/phys250/modules/module 1/diffraction_and_interference.htm |
| Atomic Force Microscope (AFM) | 11:42 | |
| Imaging using atomic force | 10:41 | |
| Advantages and disadvantages of AFM microscope | 12:49 | |
| Semi-contact (tapping) mode | 11:01 | |
| Non-contact Mode | 17:26 | |
| MFM | 11:14 |
| What is crystalline and Amorphous Material? | 14:07 | |
| Diffraction and Wave interference | 13:52 | |
| Wave diffraction in crystalline solids | 18:02 | |
| X-ray diffraction | 19:57 | |
| Main part of XRD machine | 21:26 | |
| X-ray fluorescence | 12:02 | |
| Determination of crystal structure of sample | 15:30 | |
| Study of the phase Composition of a Sample | 12:58 | |
| Calculation of Crystallite Size | 16:01 | |
| The wavelength of electron | 18:16 | |
| Electron diffraction using Transmission electron microscopy | 14:18 | |
| Electron diffraction of real materials | 12:02 | |
| Electron diffraction vs. X-ray diffraction | 11:46 |