Description |
Auger Electron Spectroscopy (AES) is based on Auger effect—a chain of radiation in an atom in which one of its inner levels is ionized. This process ends by ejection of an electron, which is known as an Auger electron. |
Mental Challenge |
How the auger electrons are labeled? |
Quizzes and Activities |
Activity: Compare the methods used for labeling auger and photon electron. |
Further Reading Sources |
1.https://www1.udel.edu/pchem/C444/info/AES_XPS.pdf 2.https://core.ac.uk/download/pdf/56369746.pdf |
| Atomic Force Microscope (AFM) | 11:42 | |
| Imaging using atomic force | 10:41 | |
| Advantages and disadvantages of AFM microscope | 12:49 | |
| Semi-contact (tapping) mode | 11:01 | |
| Non-contact Mode | 17:26 | |
| MFM | 11:14 |
| Study of the surface chemistry of material using electron spectroscopy | 18:55 | |
| X-ray photoelectron emission | 11:43 | |
| X-ray photoelectron spectroscopy (XPS) | 09:28 | |
| X-ray monochromator | 17:36 | |
| X-ray photoelectron spectrometer | 11:22 | |
| How to get the binding energy? | 09:15 | |
| Which questions XPS can answer? | 14:51 | |
| Spin-orbit splitting of XPS peaks | 11:51 | |
| Elemental shift of XPS peaks | 16:48 | |
| A real XPS analysis | 11:57 | |
| Study of the surface chemistry of material by using Auger electrons | 13:42 | |
| Kinetic energy of Auger electrons | 15:59 | |
| Auger electron spectrometer 1 | 12:12 | |
| Auger electron spectrometer 2 | 13:04 | |
| Auger electron spectroscopy | 15:41 | |
| Auger electrons vs XPS spectra | 09:04 |