Description |
This section describes the important role of imaging in comprehensive understanding of the materials properties. Imaging is a very useful technique to evaluate the shape and properties of nanoscale materials. Comparing to the classical methods, high-tech imaging has been designed specifically for characterization of the nano-sized materials. |
Mental Challenge |
What are the requirements of exploring nano-sized materials? |
Quizzes and Activities |
Activity: Please number some of the advance microscopic technology used for imaging fine materials. |
Further Reading Sources |
1. https://en.wikipedia.org/wiki/Characterization_of_nanoparticles 2. https://www.worldscientific.com/doi/10.1142/9781860945960_0008 3. https://doi.org/10.1142/9781860945960_0008 |
| Imaging of the materials | 06:46 | |
| Optical microscope | 12:22 | |
| The use of electron beam for imaging application | 09:11 | |
| The basic functions of imaging with electron beam 01 | 14:17 | |
| The basic functions of imaging with electron beam 02 | 13:24 | |
| Interaction of electron beam with sample | 15:54 |
| Atomic Force Microscope (AFM) | 11:42 | |
| Imaging using atomic force | 10:41 | |
| Advantages and disadvantages of AFM microscope | 12:49 | |
| Semi-contact (tapping) mode | 11:01 | |
| Non-contact Mode | 17:26 | |
| MFM | 11:14 |