Electron diffraction vs. X-ray diffraction

Microscopic Characterization
Category General
Difficulty Level Normal
Audience Level General
Description Microscopic characterization methods refer to scientific techniques Which allow determination of both composition and structure of a material. Optical microscopy, scanning probe microscopy and electron microscopy are known as microscopic techniques. This course illustrates how microscopic characterization techniques are used.
Overview
Microscopic methods play an essential role in nanomaterials characterization. Microscopic and X-ray based characterization of nanomaterials techniques are used for the determination of surface morphology and dispersion characteristics of nanomaterials. This course deals with details of these aspects, and will provide a fundamental understanding of morphological tools, such as instrumentation, sample preparation and different kinds of analyses, etc.


Booklet
Description
 In this lesson electron diffraction is compared with X-ray diffraction. • XRD has a low resolution while TEM has the capability of providing electron diffraction of nano-sized particles (1-10 nm). • The reflection yield of XRD is lower than TEM due to the penetration of high-energy beam to sample. • While, the diffraction pattern and an image of the lattice structure are obtained simultaneously from the electron diffraction of TEM, the XRD results in only a diffraction curve.
Mental Challenge
 What is the similarities and differences between electron and X-ray diffraction generally?
Quizzes and Activities
 Activity: Compare the diffraction pattern of polycrystalline ZnO using XRD and TEM technique.
Further Reading Sources
 1.https://pubs.acs.org/doi/pdf/10.1021/acsnano.9b05157

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