Imaging modes: constant current
Category General
Difficulty Level Normal
Audience Level General
Description Microscopic characterization methods refer to scientific techniques Which allow determination of both composition and structure of a material. Optical microscopy, scanning probe microscopy and electron microscopy are known as microscopic techniques. This course illustrates how microscopic characterization techniques are used.
Difficulty Level Normal
Audience Level General
Description Microscopic characterization methods refer to scientific techniques Which allow determination of both composition and structure of a material. Optical microscopy, scanning probe microscopy and electron microscopy are known as microscopic techniques. This course illustrates how microscopic characterization techniques are used.
Overview
Microscopic methods play an essential role in nanomaterials characterization. Microscopic and X-ray based characterization of nanomaterials techniques are used for the determination of surface morphology and dispersion characteristics of nanomaterials. This course deals with details of these aspects, and will provide a fundamental understanding of morphological tools, such as instrumentation, sample preparation and different kinds of analyses, etc.
Booklet
Microscopic methods play an essential role in nanomaterials characterization. Microscopic and X-ray based characterization of nanomaterials techniques are used for the determination of surface morphology and dispersion characteristics of nanomaterials. This course deals with details of these aspects, and will provide a fundamental understanding of morphological tools, such as instrumentation, sample preparation and different kinds of analyses, etc.
Booklet
Description |
The image of a surface topography in STM is formed in two ways. In constant current mode, tip moves along the surface, performing faster scanning. In constant height mode, tip moves above the surface at a distance of several Angstroms, and the tunneling current changes are recorded as STM image. The needle of scanning tunneling microscope in imaging constant current mode is always moved on the sample surface in three directions of length, width and height. So that the image of this microscope is a 3D image. |
Mental Challenge |
In which mode STM images can be implemented faster? |
Quizzes and Activities |
Activity: Describe how is possible to determine the surface topography of a thin layer of Aluminum fluoride using STM. |
Further Reading Sources |
1. http://ipmras.ru/UserFiles/publications/mironov/Fundamentals_SPM.pdf |
| Imaging using scanning probe microscopes (SPM) | 11:53 | |
| Scanning Tunneling Microscope (STM) | 18:14 | |
| Piezoelectric materials | 11:34 | |
| Imaging modes: constant current | 09:06 | |
| Importance of sharp tip for STM imaging | 11:23 | |
| Advantages and Limitation of STM microscope | 11:22 |
| Atomic Force Microscope (AFM) | 11:42 | |
| Imaging using atomic force | 10:41 | |
| Advantages and disadvantages of AFM microscope | 12:49 | |
| Semi-contact (tapping) mode | 11:01 | |
| Non-contact Mode | 17:26 | |
| MFM | 11:14 |