Back-scattered electron imaging

Microscopic Characterization
Category General
Difficulty Level Normal
Audience Level General
Description Microscopic characterization methods refer to scientific techniques Which allow determination of both composition and structure of a material. Optical microscopy, scanning probe microscopy and electron microscopy are known as microscopic techniques. This course illustrates how microscopic characterization techniques are used.
Overview
Microscopic methods play an essential role in nanomaterials characterization. Microscopic and X-ray based characterization of nanomaterials techniques are used for the determination of surface morphology and dispersion characteristics of nanomaterials. This course deals with details of these aspects, and will provide a fundamental understanding of morphological tools, such as instrumentation, sample preparation and different kinds of analyses, etc.


Booklet
Description
 The interaction of electron beam to the sample leads to the second types of electron, consisting of secondary and back-scattered electrons which are used in Scanning Electron Microscopy (SEM). The secondary electrons are responsible for demonstrating the surface morphology of the sample.
Mental Challenge
 What kind of electrons are called back-scattered electrons? 
Quizzes and Activities
 Activity: How many detectors are used in a SEM and what is their differences?
Further Reading Sources
 1.  https://en.wikipedia.org/wiki/Scanning_electron_microscope 

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