Atomic Force Microscope (AFM)

Microscopic Characterization
Category General
Difficulty Level Normal
Audience Level General
Description Microscopic characterization methods refer to scientific techniques Which allow determination of both composition and structure of a material. Optical microscopy, scanning probe microscopy and electron microscopy are known as microscopic techniques. This course illustrates how microscopic characterization techniques are used.
Overview
Microscopic methods play an essential role in nanomaterials characterization. Microscopic and X-ray based characterization of nanomaterials techniques are used for the determination of surface morphology and dispersion characteristics of nanomaterials. This course deals with details of these aspects, and will provide a fundamental understanding of morphological tools, such as instrumentation, sample preparation and different kinds of analyses, etc.


Booklet
Description
 The atomic Force Microscope are the most useful microscope for imaging of different materials. Simple preparation of the sample, low operation cost, being applicable for all kind of samples even bio materials are some of the important features of an AFM. Using a mechanical probe, these microscopes measure the force between the probe tip and the molecules on the surface of the sample.
Mental Challenge
 How van der waals interactions are categorized?
Quizzes and Activities
 Activity: Explain one model used for describing short-range molecular interactions (The potential of Lennard Jones)
Further Reading Sources
 1. https://ww2.chemistry.gatech.edu/~lw26/structure/molecular_interactions/mol_int.html

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Section 8