Piezoelectric materials
Category General
Difficulty Level Normal
Audience Level General
Description Microscopic characterization methods refer to scientific techniques Which allow determination of both composition and structure of a material. Optical microscopy, scanning probe microscopy and electron microscopy are known as microscopic techniques. This course illustrates how microscopic characterization techniques are used.
Difficulty Level Normal
Audience Level General
Description Microscopic characterization methods refer to scientific techniques Which allow determination of both composition and structure of a material. Optical microscopy, scanning probe microscopy and electron microscopy are known as microscopic techniques. This course illustrates how microscopic characterization techniques are used.
Overview
Microscopic methods play an essential role in nanomaterials characterization. Microscopic and X-ray based characterization of nanomaterials techniques are used for the determination of surface morphology and dispersion characteristics of nanomaterials. This course deals with details of these aspects, and will provide a fundamental understanding of morphological tools, such as instrumentation, sample preparation and different kinds of analyses, etc.
Booklet
Microscopic methods play an essential role in nanomaterials characterization. Microscopic and X-ray based characterization of nanomaterials techniques are used for the determination of surface morphology and dispersion characteristics of nanomaterials. This course deals with details of these aspects, and will provide a fundamental understanding of morphological tools, such as instrumentation, sample preparation and different kinds of analyses, etc.
Booklet
Description |
Piezoelectric materials generate internal electrical charge from an applied mechanical stress The probe microscope scanners are made of piezoelectric materials. Piezoelectric materials change their size in an external electric field. |
Mental Challenge |
How is the interaction of a metal needle and a conducting sample? |
Further Reading Sources |
1. https://my.eng.utah.edu/~lzang/images/Lecture_6_STM.pdf |
| Imaging using scanning probe microscopes (SPM) | 11:53 | |
| Scanning Tunneling Microscope (STM) | 18:14 | |
| Piezoelectric materials | 11:34 | |
| Imaging modes: constant current | 09:06 | |
| Importance of sharp tip for STM imaging | 11:23 | |
| Advantages and Limitation of STM microscope | 11:22 |
| Atomic Force Microscope (AFM) | 11:42 | |
| Imaging using atomic force | 10:41 | |
| Advantages and disadvantages of AFM microscope | 12:49 | |
| Semi-contact (tapping) mode | 11:01 | |
| Non-contact Mode | 17:26 | |
| MFM | 11:14 |