Description |
X-ray photoelectron spectroscopy (XPS) is a highly sensitive analytical technique used to analyze the elemental composition, empirical formulas, chemical state, and electronic state of the surface of a composite material. |
Mental Challenge |
Why binding energy and core electron are so important? |
Quizzes and Activities |
Activity: Explain about different technique of core level spectroscopies. |
Further Reading Sources |
1.https://www-ssrl.slac.stanford.edu/nilssongroup/corelevel.html 2.https://courses.lumenlearning.com/introchem/chapter/nuclear-binding-energy-and-mass-defect/ |
| Atomic Force Microscope (AFM) | 11:42 | |
| Imaging using atomic force | 10:41 | |
| Advantages and disadvantages of AFM microscope | 12:49 | |
| Semi-contact (tapping) mode | 11:01 | |
| Non-contact Mode | 17:26 | |
| MFM | 11:14 |
| Study of the surface chemistry of material using electron spectroscopy | 18:55 | |
| X-ray photoelectron emission | 11:43 | |
| X-ray photoelectron spectroscopy (XPS) | 09:28 | |
| X-ray monochromator | 17:36 | |
| X-ray photoelectron spectrometer | 11:22 | |
| How to get the binding energy? | 09:15 | |
| Which questions XPS can answer? | 14:51 | |
| Spin-orbit splitting of XPS peaks | 11:51 | |
| Elemental shift of XPS peaks | 16:48 | |
| A real XPS analysis | 11:57 | |
| Study of the surface chemistry of material by using Auger electrons | 13:42 | |
| Kinetic energy of Auger electrons | 15:59 | |
| Auger electron spectrometer 1 | 12:12 | |
| Auger electron spectrometer 2 | 13:04 | |
| Auger electron spectroscopy | 15:41 | |
| Auger electrons vs XPS spectra | 09:04 |