Which questions XPS can answer?

Microscopic Characterization
Category General
Difficulty Level Normal
Audience Level General
Description Microscopic characterization methods refer to scientific techniques Which allow determination of both composition and structure of a material. Optical microscopy, scanning probe microscopy and electron microscopy are known as microscopic techniques. This course illustrates how microscopic characterization techniques are used.
Overview
Microscopic methods play an essential role in nanomaterials characterization. Microscopic and X-ray based characterization of nanomaterials techniques are used for the determination of surface morphology and dispersion characteristics of nanomaterials. This course deals with details of these aspects, and will provide a fundamental understanding of morphological tools, such as instrumentation, sample preparation and different kinds of analyses, etc.


Booklet
Description
 This lesson describes the type of information that can be obtained from an unknown sample using XPS. The intensity of the photoelectron emitted from the surface of a sample is related to the depth of photoelectron formation and the angle that photoelectron move away from the surface.
Mental Challenge
 What data can be obtained from the XPS?
Quizzes and Activities
 Activity: Describe the relation between Eb and photoelectrons.
Further Reading Sources
 1.https://ethz.ch/content/dam/ethz/special-interest/chab/icb/van-bokhoven-group-dam/coursework/Characterization-Techniques/2015/xps2015.pdf 

Section 1

Section 2

Section 3

Section 4

Section 5

Section 6

Section 7

Section 8