Interaction of electron beam with sample
Category General
Difficulty Level Normal
Audience Level General
Description Microscopic characterization methods refer to scientific techniques Which allow determination of both composition and structure of a material. Optical microscopy, scanning probe microscopy and electron microscopy are known as microscopic techniques. This course illustrates how microscopic characterization techniques are used.
Difficulty Level Normal
Audience Level General
Description Microscopic characterization methods refer to scientific techniques Which allow determination of both composition and structure of a material. Optical microscopy, scanning probe microscopy and electron microscopy are known as microscopic techniques. This course illustrates how microscopic characterization techniques are used.
Overview
Microscopic methods play an essential role in nanomaterials characterization. Microscopic and X-ray based characterization of nanomaterials techniques are used for the determination of surface morphology and dispersion characteristics of nanomaterials. This course deals with details of these aspects, and will provide a fundamental understanding of morphological tools, such as instrumentation, sample preparation and different kinds of analyses, etc.
Booklet
Microscopic methods play an essential role in nanomaterials characterization. Microscopic and X-ray based characterization of nanomaterials techniques are used for the determination of surface morphology and dispersion characteristics of nanomaterials. This course deals with details of these aspects, and will provide a fundamental understanding of morphological tools, such as instrumentation, sample preparation and different kinds of analyses, etc.
Booklet
Description |
In this lesson the interaction of electron and material has been described in details. The interaction between the electron beam and the sample lead to production of different types of electrons and electromagnetic beams. Electron with the energy of 50 kV are produced during the non-elastic interaction. Secondary electron with the energy of 3- 50 kV are another types of electron emitted from the surface of the materials. Auger electron resulted from the interaction of electron beam with the surface of the sample, are only useful for recognizing the chemical nature of the sample. Electrons with high level of energy which can pass through the sample are named as transmission electron. All these electrons are produced simultaneously during the interaction of electron beam with the sample. |
Mental Challenge |
Which types of electron are suitable for imaging with electronic microscope? |
Quizzes and Activities |
Activity: Compare different types of interactions, make a list from the resulted electrons and consider their application in characterization of a sample. |
Further Reading Sources |
1. http://academic.uprm.edu/pcaceres/Courses/CHAMINA/HO5.pdf |
| Imaging of the materials | 06:46 | |
| Optical microscope | 12:22 | |
| The use of electron beam for imaging application | 09:11 | |
| The basic functions of imaging with electron beam 01 | 14:17 | |
| The basic functions of imaging with electron beam 02 | 13:24 | |
| Interaction of electron beam with sample | 15:54 |
| Atomic Force Microscope (AFM) | 11:42 | |
| Imaging using atomic force | 10:41 | |
| Advantages and disadvantages of AFM microscope | 12:49 | |
| Semi-contact (tapping) mode | 11:01 | |
| Non-contact Mode | 17:26 | |
| MFM | 11:14 |