Description |
Photoelectric peaks shift in EB with difference of X-ray photon energy hν, when another excitation source is used. The shift in XPS peaks can be grouped as elemental shift or chemical shift. Position of orbitals in atom is sensitive to chemical environment of atom. For different chemical bonds of elements, different peak components can appear. Sometimes there is no additional peak but the energy shift of main element peak is observed. These energy shifts which is called chemical shifts are used to interpret the bonding of elements. |
Mental Challenge |
What does the binding energy peak position of an element depend on? |
Quizzes and Activities |
Activity: Discuss how the chemical shifts happen. Use an example of the lithium 1s levels in lithium metal and lithium oxide. |
Further Reading Sources |
1.http://mafija.fmf.uni-lj.si/seminar/files/2013_2014/XPS024.pdf |
| Atomic Force Microscope (AFM) | 11:42 | |
| Imaging using atomic force | 10:41 | |
| Advantages and disadvantages of AFM microscope | 12:49 | |
| Semi-contact (tapping) mode | 11:01 | |
| Non-contact Mode | 17:26 | |
| MFM | 11:14 |
| Study of the surface chemistry of material using electron spectroscopy | 18:55 | |
| X-ray photoelectron emission | 11:43 | |
| X-ray photoelectron spectroscopy (XPS) | 09:28 | |
| X-ray monochromator | 17:36 | |
| X-ray photoelectron spectrometer | 11:22 | |
| How to get the binding energy? | 09:15 | |
| Which questions XPS can answer? | 14:51 | |
| Spin-orbit splitting of XPS peaks | 11:51 | |
| Elemental shift of XPS peaks | 16:48 | |
| A real XPS analysis | 11:57 | |
| Study of the surface chemistry of material by using Auger electrons | 13:42 | |
| Kinetic energy of Auger electrons | 15:59 | |
| Auger electron spectrometer 1 | 12:12 | |
| Auger electron spectrometer 2 | 13:04 | |
| Auger electron spectroscopy | 15:41 | |
| Auger electrons vs XPS spectra | 09:04 |