Auger electron spectroscopy

Microscopic Characterization
Category General
Difficulty Level Normal
Audience Level General
Description Microscopic characterization methods refer to scientific techniques Which allow determination of both composition and structure of a material. Optical microscopy, scanning probe microscopy and electron microscopy are known as microscopic techniques. This course illustrates how microscopic characterization techniques are used.
Overview
Microscopic methods play an essential role in nanomaterials characterization. Microscopic and X-ray based characterization of nanomaterials techniques are used for the determination of surface morphology and dispersion characteristics of nanomaterials. This course deals with details of these aspects, and will provide a fundamental understanding of morphological tools, such as instrumentation, sample preparation and different kinds of analyses, etc.


Booklet
Description
 The direct detection of the chemical state of an element can be investigated using Auger spectrum. Interestingly, Auger sputter depth profiling has become the most popular choice for chemical analysis of thin films. The goal of quantitative analysis by AES is to determine the chemical composition of solid surfaces by calculating atomic concentrations from Auger peak intensity measurements. Scanning Auger microscopy (SAM) can be used effectively for imaging nanoscale structures and to produce two-dimensional maps of surface elemental composition.
Mental Challenge
 The quantitative analysis in different spectrum.
Quizzes and Activities
 Activity: Find the schematic diagram of a scanning Auger microscope 
Further Reading Sources
 1.https://physweb.bgu.ac.il/COURSES/LAB_C/UHV/LEED/Auger Electron Spectroscopy.pdf

Section 1

Section 2

Section 3

Section 4

Section 5

Section 6

Section 7

Section 8