Electron diffraction using Transmission electron microscopy
Category General
Difficulty Level Normal
Audience Level General
Description Microscopic characterization methods refer to scientific techniques Which allow determination of both composition and structure of a material. Optical microscopy, scanning probe microscopy and electron microscopy are known as microscopic techniques. This course illustrates how microscopic characterization techniques are used.
Difficulty Level Normal
Audience Level General
Description Microscopic characterization methods refer to scientific techniques Which allow determination of both composition and structure of a material. Optical microscopy, scanning probe microscopy and electron microscopy are known as microscopic techniques. This course illustrates how microscopic characterization techniques are used.
Overview
Microscopic methods play an essential role in nanomaterials characterization. Microscopic and X-ray based characterization of nanomaterials techniques are used for the determination of surface morphology and dispersion characteristics of nanomaterials. This course deals with details of these aspects, and will provide a fundamental understanding of morphological tools, such as instrumentation, sample preparation and different kinds of analyses, etc.
Booklet
Microscopic methods play an essential role in nanomaterials characterization. Microscopic and X-ray based characterization of nanomaterials techniques are used for the determination of surface morphology and dispersion characteristics of nanomaterials. This course deals with details of these aspects, and will provide a fundamental understanding of morphological tools, such as instrumentation, sample preparation and different kinds of analyses, etc.
Booklet
Description |
When the electron beam is exposed to this crystalline sample, some of it passes through the unmodified form, and the other part is deflected by an elastic interaction in a certain direction. The objective lens forms a diffraction pattern in the back focal plane with electrons scattered by the sample and combines them to generate an image in the image plane (1. intermediate image). Thus, diffraction pattern and image are simultaneously present in the TEM. Selected area (electron) diffraction (abbreviated as SAD or SAED), is a crystallographic experimental technique that can be performed inside a transmission electron microscope (TEM). |
Mental Challenge |
What would happen if a single electron beam strikes a large number of crystal planes instead of a single crystal plane? |
Quizzes and Activities |
Activity: Compare the capability of selected area electron diffraction (SAED) to XRD in studying of the crystal structure of nanomaterials. |
Further Reading Sources |
1.http://journals.iucr.org/a/issues/2013/01/00/wl5169/wl5169sup2.pdf 2.https://www.microscopy.ethz.ch/TEMED.htm 3.https://www.microscopy.ethz.ch/ED-1.htm |
| Atomic Force Microscope (AFM) | 11:42 | |
| Imaging using atomic force | 10:41 | |
| Advantages and disadvantages of AFM microscope | 12:49 | |
| Semi-contact (tapping) mode | 11:01 | |
| Non-contact Mode | 17:26 | |
| MFM | 11:14 |
| What is crystalline and Amorphous Material? | 14:07 | |
| Diffraction and Wave interference | 13:52 | |
| Wave diffraction in crystalline solids | 18:02 | |
| X-ray diffraction | 19:57 | |
| Main part of XRD machine | 21:26 | |
| X-ray fluorescence | 12:02 | |
| Determination of crystal structure of sample | 15:30 | |
| Study of the phase Composition of a Sample | 12:58 | |
| Calculation of Crystallite Size | 16:01 | |
| The wavelength of electron | 18:16 | |
| Electron diffraction using Transmission electron microscopy | 14:18 | |
| Electron diffraction of real materials | 12:02 | |
| Electron diffraction vs. X-ray diffraction | 11:46 |