Description |
The dark and light field images obtained from the sample using transmission electron microscopy (TEM), provide us important information about the components of a sample. In light and dark field images, the dark and light points both are related to heavier atoms, respectively. Hence, the thickness and the types of the materials can be discussed from a TEM image. |
Mental Challenge |
How we can recognize a dark field image from the light field image? |
Quizzes and Activities |
Activity: Describe the sample preparation of a carbon material coated with a silver layer. |
Further Reading Sources |
1. https://www.pdx.edu/sites/www.pdx.edu.cemn/files/TEM_manual.pdf |
| Imaging techniques with transmission electron microscopy | 17:29 | |
| Operating conditions of TEM | 14:26 | |
| High resolution TEM (HR-TEM) and scanning TEM (STEM) | 11:58 |
| Atomic Force Microscope (AFM) | 11:42 | |
| Imaging using atomic force | 10:41 | |
| Advantages and disadvantages of AFM microscope | 12:49 | |
| Semi-contact (tapping) mode | 11:01 | |
| Non-contact Mode | 17:26 | |
| MFM | 11:14 |