X-ray fluorescence
Category General
Difficulty Level Normal
Audience Level General
Description Microscopic characterization methods refer to scientific techniques Which allow determination of both composition and structure of a material. Optical microscopy, scanning probe microscopy and electron microscopy are known as microscopic techniques. This course illustrates how microscopic characterization techniques are used.
Difficulty Level Normal
Audience Level General
Description Microscopic characterization methods refer to scientific techniques Which allow determination of both composition and structure of a material. Optical microscopy, scanning probe microscopy and electron microscopy are known as microscopic techniques. This course illustrates how microscopic characterization techniques are used.
Overview
Microscopic methods play an essential role in nanomaterials characterization. Microscopic and X-ray based characterization of nanomaterials techniques are used for the determination of surface morphology and dispersion characteristics of nanomaterials. This course deals with details of these aspects, and will provide a fundamental understanding of morphological tools, such as instrumentation, sample preparation and different kinds of analyses, etc.
Booklet
Microscopic methods play an essential role in nanomaterials characterization. Microscopic and X-ray based characterization of nanomaterials techniques are used for the determination of surface morphology and dispersion characteristics of nanomaterials. This course deals with details of these aspects, and will provide a fundamental understanding of morphological tools, such as instrumentation, sample preparation and different kinds of analyses, etc.
Booklet
Description |
X-ray fluorescence (XRF) is a process whereby electrons are displaced from their atomic orbital positions, releasing a burst of energy that is characteristic of a specific element. In a modern commercial X-ray diffractometer, optic tools eliminate fluorescence beams. |
Mental Challenge |
How is possible to eliminate or reduce the fluorescence effect when studying XRD pattern of materials? |
Quizzes and Activities |
Activity: Compare the XRD patterns of a crystal and amorphous material |
Further Reading Sources |
1.https://lab-training.com/2016/07/23/x-ray-diffraction-xrd-x-ray-fluorescence-xrf-different/ 2.http://physics.usask.ca/~bzulkosk/modphyslab/phys381manual/xray_diffraction_2004.pdf |
| Atomic Force Microscope (AFM) | 11:42 | |
| Imaging using atomic force | 10:41 | |
| Advantages and disadvantages of AFM microscope | 12:49 | |
| Semi-contact (tapping) mode | 11:01 | |
| Non-contact Mode | 17:26 | |
| MFM | 11:14 |