The basic functions of imaging with electron beam 02

Microscopic Characterization
Category General
Difficulty Level Normal
Audience Level General
Description Microscopic characterization methods refer to scientific techniques Which allow determination of both composition and structure of a material. Optical microscopy, scanning probe microscopy and electron microscopy are known as microscopic techniques. This course illustrates how microscopic characterization techniques are used.
Overview
Microscopic methods play an essential role in nanomaterials characterization. Microscopic and X-ray based characterization of nanomaterials techniques are used for the determination of surface morphology and dispersion characteristics of nanomaterials. This course deals with details of these aspects, and will provide a fundamental understanding of morphological tools, such as instrumentation, sample preparation and different kinds of analyses, etc.


Booklet
Description
 In order to increase the velocity of the electron beams, an anode accelerator is used. The quality of the final image is based on the quality of the electron beams. An accelerated electron beam passes through the center of a magnetic lens, in which the beams are concentrated. After which, the concentrated electron beam can easily and precisely move on the surface of samples using scan coil. Finally, the surface image of the sample can be obtained.
Mental Challenge
 What is the important features of the electron beam for imaging?
Quizzes and Activities
 Activity: What are the different parameters considered for selecting an electron gun? 
Further Reading Sources

1. https://personal.ems.psu.edu/~ryba/harbin/SEM.ppt.pdf

2. https://link.springer.com/chapter/10.1007/978-3-540-38967-5_2

Section 1

Section 2

Section 3

Section 4

Section 5

Section 6

Section 7

Section 8