X-ray diffraction
Category General
Difficulty Level Normal
Audience Level General
Description Microscopic characterization methods refer to scientific techniques Which allow determination of both composition and structure of a material. Optical microscopy, scanning probe microscopy and electron microscopy are known as microscopic techniques. This course illustrates how microscopic characterization techniques are used.
Difficulty Level Normal
Audience Level General
Description Microscopic characterization methods refer to scientific techniques Which allow determination of both composition and structure of a material. Optical microscopy, scanning probe microscopy and electron microscopy are known as microscopic techniques. This course illustrates how microscopic characterization techniques are used.
Overview
Microscopic methods play an essential role in nanomaterials characterization. Microscopic and X-ray based characterization of nanomaterials techniques are used for the determination of surface morphology and dispersion characteristics of nanomaterials. This course deals with details of these aspects, and will provide a fundamental understanding of morphological tools, such as instrumentation, sample preparation and different kinds of analyses, etc.
Booklet
Microscopic methods play an essential role in nanomaterials characterization. Microscopic and X-ray based characterization of nanomaterials techniques are used for the determination of surface morphology and dispersion characteristics of nanomaterials. This course deals with details of these aspects, and will provide a fundamental understanding of morphological tools, such as instrumentation, sample preparation and different kinds of analyses, etc.
Booklet
Description |
X-Ray crystallography is currently the most favored technique for structure determination of atoms and molecules. Miller indices are used to specify directions and planes. These directions and planes could be in lattices or in crystals. In the powder (Debye-Scherrer) method, the x-rays fall on a mass of tiny crystals in all orientations, and the diffracted beams of each order h, k, i form a cone. The X-ray diffraction pattern is the fingerprint of periodic atomic arrangements in a given material. |
Mental Challenge |
How is possible to measure the intensity of diffracted beam? |
Quizzes and Activities |
Activity: Compare the X-ray diffraction of a diamond with graphite. |
Further Reading Sources |
1. https://en.wikipedia.org/wiki/Crystallography 2. https://www.sciencedirect.com/topics/materials-science/x-ray-diffraction |
| Atomic Force Microscope (AFM) | 11:42 | |
| Imaging using atomic force | 10:41 | |
| Advantages and disadvantages of AFM microscope | 12:49 | |
| Semi-contact (tapping) mode | 11:01 | |
| Non-contact Mode | 17:26 | |
| MFM | 11:14 |