The basic functions of imaging with electron beam 01

Microscopic Characterization
Category General
Difficulty Level Normal
Audience Level General
Description Microscopic characterization methods refer to scientific techniques Which allow determination of both composition and structure of a material. Optical microscopy, scanning probe microscopy and electron microscopy are known as microscopic techniques. This course illustrates how microscopic characterization techniques are used.
Overview
Microscopic methods play an essential role in nanomaterials characterization. Microscopic and X-ray based characterization of nanomaterials techniques are used for the determination of surface morphology and dispersion characteristics of nanomaterials. This course deals with details of these aspects, and will provide a fundamental understanding of morphological tools, such as instrumentation, sample preparation and different kinds of analyses, etc.


Booklet
Description
 In this lesson electron microscopic and its function has been described, briefly. As the electron beam can easily adsorbed by the surrounding media, it is essential to have a vacuum chamber in which electron can freely move to reach the surface of the material. Apart from the low pressure of the chamber, it is important to use a specific electron gun that emit electron beams with the highest level of energy.
Mental Challenge
 How does an electron gun work?
Quizzes and Activities
 Activity: Number three different electron guns used in electron microscopy. What are their differences?
Further Reading Sources

1. https://www.sciencedirect.com/topics/earth-and-planetary-sciences/electron-guns

2. http://inspirehep.net/record/1314372/files/mopri040.pdf

Section 1

Section 2

Section 3

Section 4

Section 5

Section 6

Section 7

Section 8