Description |
The analysis of a surface and its local properties are performed by scanning probe microscopes, using specially prepared tips like a needle. Sample preparation for STM imaging depends on the conductivity of materials. |
Mental Challenge |
What types of tip are usually used for tunneling microscope? |
Quizzes and Activities |
Activity: Explain the importance of STM tips preparation. |
Further Reading Sources |
1. https://teachers.stanford.edu/activities/SPMReference/SPMReference.pdf |
| Imaging using scanning probe microscopes (SPM) | 11:53 | |
| Scanning Tunneling Microscope (STM) | 18:14 | |
| Piezoelectric materials | 11:34 | |
| Imaging modes: constant current | 09:06 | |
| Importance of sharp tip for STM imaging | 11:23 | |
| Advantages and Limitation of STM microscope | 11:22 |
| Atomic Force Microscope (AFM) | 11:42 | |
| Imaging using atomic force | 10:41 | |
| Advantages and disadvantages of AFM microscope | 12:49 | |
| Semi-contact (tapping) mode | 11:01 | |
| Non-contact Mode | 17:26 | |
| MFM | 11:14 |