Description |
Based on the chemical structure of sample and comparing the XRD data of sample with references, the crystal plane of sample can be determined. |
Mental Challenge |
How it is possible to analysis the diffraction pattern when we do not know the chemical structure of the sample? |
Quizzes and Activities |
Activity: Find the crystal planes of the atoms of copper using its diffraction patterns. |
Further Reading Sources |
1. http://www.cryst.chem.uu.nl/huub/notesweb.pdf |
| Atomic Force Microscope (AFM) | 11:42 | |
| Imaging using atomic force | 10:41 | |
| Advantages and disadvantages of AFM microscope | 12:49 | |
| Semi-contact (tapping) mode | 11:01 | |
| Non-contact Mode | 17:26 | |
| MFM | 11:14 |
| What is crystalline and Amorphous Material? | 14:07 | |
| Diffraction and Wave interference | 13:52 | |
| Wave diffraction in crystalline solids | 18:02 | |
| X-ray diffraction | 19:57 | |
| Main part of XRD machine | 21:26 | |
| X-ray fluorescence | 12:02 | |
| Determination of crystal structure of sample | 15:30 | |
| Study of the phase Composition of a Sample | 12:58 | |
| Calculation of Crystallite Size | 16:01 | |
| The wavelength of electron | 18:16 | |
| Electron diffraction using Transmission electron microscopy | 14:18 | |
| Electron diffraction of real materials | 12:02 | |
| Electron diffraction vs. X-ray diffraction | 11:46 |