Auger electron spectrometer 1

Microscopic Characterization
Category General
Difficulty Level Normal
Audience Level General
Description Microscopic characterization methods refer to scientific techniques Which allow determination of both composition and structure of a material. Optical microscopy, scanning probe microscopy and electron microscopy are known as microscopic techniques. This course illustrates how microscopic characterization techniques are used.
Overview
Microscopic methods play an essential role in nanomaterials characterization. Microscopic and X-ray based characterization of nanomaterials techniques are used for the determination of surface morphology and dispersion characteristics of nanomaterials. This course deals with details of these aspects, and will provide a fundamental understanding of morphological tools, such as instrumentation, sample preparation and different kinds of analyses, etc.


Booklet
Description
 The component of a typical Auger electron spectrometer has been described in this lesson. The most commonly used energy analyzers in AES are: (i) the retarding field analyzer (RFA), (ii) the cylindrical mirror analyzer (CMA), and (iii) the concentric hemispherical analyzer (CHA).
Mental Challenge
 What is the basic components of a typical Auger electron spectrometer? 
Quizzes and Activities
 Activity: Compare the differences between CMA and CHA in Auger electron spectrometer.
Further Reading Sources
 1.https://www.wellesley.edu/sites/default/files/assets/departments/chemistry/files/2006_auger.pdf 

Section 1

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Section 3

Section 4

Section 5

Section 6

Section 7

Section 8