Description |
In this lesson, the useful application of optical microscope for imaging of small materials has been presented. Simply, an optical microscope is composed of a light source, a converging lens, an objective lens, and an eye lens. Depth of field and image resolution are two crucial parameters in the imaging process. Optical microscopy is not suitable for observing nanomaterials due to limitations such as low magnification, limited depth of field, and low resolution. |
Mental Challenge |
Why a metal nanoparticle with a dimension of 50 nm cannot be observed through optical microscope? |
Quizzes and Activities |
Activity: What factors do we need to consider in imaging of the samples which are not flat? |
Further Reading Sources |
1. https://www.sciencedirect.com/topics/engineering/optical-microscope |
| Imaging of the materials | 06:46 | |
| Optical microscope | 12:22 | |
| The use of electron beam for imaging application | 09:11 | |
| The basic functions of imaging with electron beam 01 | 14:17 | |
| The basic functions of imaging with electron beam 02 | 13:24 | |
| Interaction of electron beam with sample | 15:54 |
| Atomic Force Microscope (AFM) | 11:42 | |
| Imaging using atomic force | 10:41 | |
| Advantages and disadvantages of AFM microscope | 12:49 | |
| Semi-contact (tapping) mode | 11:01 | |
| Non-contact Mode | 17:26 | |
| MFM | 11:14 |