X-ray photoelectron spectroscopy (XPS)

Microscopic Characterization
Category General
Difficulty Level Normal
Audience Level General
Description Microscopic characterization methods refer to scientific techniques Which allow determination of both composition and structure of a material. Optical microscopy, scanning probe microscopy and electron microscopy are known as microscopic techniques. This course illustrates how microscopic characterization techniques are used.
Overview
Microscopic methods play an essential role in nanomaterials characterization. Microscopic and X-ray based characterization of nanomaterials techniques are used for the determination of surface morphology and dispersion characteristics of nanomaterials. This course deals with details of these aspects, and will provide a fundamental understanding of morphological tools, such as instrumentation, sample preparation and different kinds of analyses, etc.


Booklet
Description
 X-ray photoelectron spectroscopy (XPS) is a surface analysis technique which provides both elemental and chemical state information. The sample is illuminated with X-rays monochromatic or unfiltered Al Kα or Mg Kα and photoelectrons are emitted from the surface. The kinetic energy of these emitted electrons is characteristic of the element from which the photoelectron originated. The position and intensity of the peaks in an energy spectrum provide the desired chemical state and quantitative information.
Mental Challenge
 Why XPS instrument is equipped with ultra-high vacuum? 
Quizzes and Activities
 Activity: Compare the two technique of near ambient photoelectron spectroscopy and X-ray electron spectroscopy. 
Further Reading Sources
 1.http://sustainable-nano.com/2017/07/26/x-ray-photoelectron-spectroscopy/

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Section 8