Description |
The interaction of an electron beam with a solid sample results in the emission of secondary and back-scattered electrons. A direct Auger spectrum is represented as a plot of the number of electrons detected as a function of electron kinetic energy. The derivative spectrum helps to accentuate the Auger signal by suppressing the background due to secondary and back-scattered electrons. Chemical shifts, or, equivalently, energy shifts, occur when there is a charge transfer from one atom to another. |
Mental Challenge |
What are the features of secondary and backscattered electron distribution? |
Quizzes and Activities |
Activity: Find the direct and differentiated spectrum of copper. |
Further Reading Sources |
1.https://public.wsu.edu/~scudiero/documents/571-Auger-Lecture.pdf |
| Atomic Force Microscope (AFM) | 11:42 | |
| Imaging using atomic force | 10:41 | |
| Advantages and disadvantages of AFM microscope | 12:49 | |
| Semi-contact (tapping) mode | 11:01 | |
| Non-contact Mode | 17:26 | |
| MFM | 11:14 |
| Study of the surface chemistry of material using electron spectroscopy | 18:55 | |
| X-ray photoelectron emission | 11:43 | |
| X-ray photoelectron spectroscopy (XPS) | 09:28 | |
| X-ray monochromator | 17:36 | |
| X-ray photoelectron spectrometer | 11:22 | |
| How to get the binding energy? | 09:15 | |
| Which questions XPS can answer? | 14:51 | |
| Spin-orbit splitting of XPS peaks | 11:51 | |
| Elemental shift of XPS peaks | 16:48 | |
| A real XPS analysis | 11:57 | |
| Study of the surface chemistry of material by using Auger electrons | 13:42 | |
| Kinetic energy of Auger electrons | 15:59 | |
| Auger electron spectrometer 1 | 12:12 | |
| Auger electron spectrometer 2 | 13:04 | |
| Auger electron spectroscopy | 15:41 | |
| Auger electrons vs XPS spectra | 09:04 |