X-ray photoelectron spectrometer

Microscopic Characterization
Category General
Difficulty Level Normal
Audience Level General
Description Microscopic characterization methods refer to scientific techniques Which allow determination of both composition and structure of a material. Optical microscopy, scanning probe microscopy and electron microscopy are known as microscopic techniques. This course illustrates how microscopic characterization techniques are used.
Overview
Microscopic methods play an essential role in nanomaterials characterization. Microscopic and X-ray based characterization of nanomaterials techniques are used for the determination of surface morphology and dispersion characteristics of nanomaterials. This course deals with details of these aspects, and will provide a fundamental understanding of morphological tools, such as instrumentation, sample preparation and different kinds of analyses, etc.


Booklet
Description
 In this section the main components of a XPS device has been demonstrated. The outlined description about an XPS analysis include X-ray irradiation, photoelectron excitement and electron’s kinetic energy measurement. The precision of an analyzing area is in micron, depends on the size of the adjustable focused X-ray beam.
Mental Challenge
 What is the advantage of using ionic gun in X-ray photoelectron spectroscopy?
Quizzes and Activities
 Activity: Draw a schematic of an X-ray photoelectron spectrometer and describe the performance of each part in a paragraph.
Further Reading Sources
 1.https://cse.wwu.edu/amsec/x-ray-photoelectron-spectrometer-xps 

Section 1

Section 2

Section 3

Section 4

Section 5

Section 6

Section 7

Section 8