Imaging using atomic force
Category General
Difficulty Level Normal
Audience Level General
Description Microscopic characterization methods refer to scientific techniques Which allow determination of both composition and structure of a material. Optical microscopy, scanning probe microscopy and electron microscopy are known as microscopic techniques. This course illustrates how microscopic characterization techniques are used.
Difficulty Level Normal
Audience Level General
Description Microscopic characterization methods refer to scientific techniques Which allow determination of both composition and structure of a material. Optical microscopy, scanning probe microscopy and electron microscopy are known as microscopic techniques. This course illustrates how microscopic characterization techniques are used.
Overview
Microscopic methods play an essential role in nanomaterials characterization. Microscopic and X-ray based characterization of nanomaterials techniques are used for the determination of surface morphology and dispersion characteristics of nanomaterials. This course deals with details of these aspects, and will provide a fundamental understanding of morphological tools, such as instrumentation, sample preparation and different kinds of analyses, etc.
Booklet
Microscopic methods play an essential role in nanomaterials characterization. Microscopic and X-ray based characterization of nanomaterials techniques are used for the determination of surface morphology and dispersion characteristics of nanomaterials. This course deals with details of these aspects, and will provide a fundamental understanding of morphological tools, such as instrumentation, sample preparation and different kinds of analyses, etc.
Booklet
Description |
This lesson describes the imaging procedure of AFM. Dynamic atomic force microscopy, in essence, consists of a vibrating microcantilever with a nanoscale tip that interacts with a sample surface via short- and long-range intermolecular forces. Piezoelectric scanners are used in AFM and it are designed to move in x, y, and z axis by expanding in some directions and contracting in others |
Mental Challenge |
What is the differences between AFM and SEM/TEM? |
Quizzes and Activities |
Activity: Search and find the AFM images of an insect! |
Further Reading Sources |
1. http://web.pdx.edu/~pmoeck/phy381/Topic3C-SPM-Extra.pdf 2.https://www.sciencedirect.com/science/article/pii/S1748013208700124 |
| Atomic Force Microscope (AFM) | 11:42 | |
| Imaging using atomic force | 10:41 | |
| Advantages and disadvantages of AFM microscope | 12:49 | |
| Semi-contact (tapping) mode | 11:01 | |
| Non-contact Mode | 17:26 | |
| MFM | 11:14 |