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Imaging techniques with transmission electron microscopy

Microscopic Characterization

Category General
Difficulty Level Normal
Audience Level General
Description Microscopic characterization methods refer to scientific techniques Which allow determination of both composition and structure of a material. Optical microscopy, scanning probe microscopy and electron microscopy are known as microscopic techniques. This course illustrates how microscopic characterization techniques are used.

Overview
Microscopic methods play an essential role in nanomaterials characterization. Microscopic and X-ray based characterization of nanomaterials techniques are used for the determination of surface morphology and dispersion characteristics of nanomaterials. This course deals with details of these aspects, and will provide a fundamental understanding of morphological tools, such as instrumentation, sample preparation and different kinds of analyses, etc.

Booklet

Description	In this lesson transmission electron microscopy (TEM) as a powerful tool for observing nanomaterials has been presented. Electron with various types of deviation can be transmitted from the samples. The one with low or no deviation is demonstrated with a sensitive screen. The dark and light fields resulted from the interaction of the electrons with the screen, make a specific image from the sample. After that the difference between dark and light field images has been explained. Furthermore, the components of a transmission electron microscopy have been demonstrated.
Mental Challenge	How many types of electron transmitted from the sample? and What is the difference between the dark and light field images?
Quizzes and Activities	Activity: Describe the imaging process of a sample using a transmission electron microscopy.
Further Reading Sources	1. https://www.sciencedirect.com/science/article/pii/B9780444637765000085

Section 1

	Imaging of the materials	06:46
	Optical microscope	12:22
	The use of electron beam for imaging application	09:11
	The basic functions of imaging with electron beam 01	14:17
	The basic functions of imaging with electron beam 02	13:24
	Interaction of electron beam with sample	15:54

Section 2

	Imaging techniques with transmission electron microscopy	17:29
	Operating conditions of TEM	14:26
	High resolution TEM (HR-TEM) and scanning TEM (STEM)	11:58

Section 3

	Back-scattered electron imaging	16:40
	Scanning electron microscope imaging	10:24
	Important points about electron microscopy (EM)	13:16

Section 4

Elemental analysis using Electron Microscopes

21:01

Section 5

	Imaging using scanning probe microscopes (SPM)	11:53
	Scanning Tunneling Microscope (STM)	18:14
	Piezoelectric materials	11:34
	Imaging modes: constant current	09:06
	Importance of sharp tip for STM imaging	11:23
	Advantages and Limitation of STM microscope	11:22

Section 6

	Atomic Force Microscope (AFM)	11:42
	Imaging using atomic force	10:41
	Advantages and disadvantages of AFM microscope	12:49
	Semi-contact (tapping) mode	11:01
	Non-contact Mode	17:26
	MFM	11:14

Section 7

	What is crystalline and Amorphous Material?	14:07
	Diffraction and Wave interference	13:52
	Wave diffraction in crystalline solids	18:02
	X-ray diffraction	19:57
	Main part of XRD machine	21:26
	X-ray fluorescence	12:02
	Determination of crystal structure of sample	15:30
	Study of the phase Composition of a Sample	12:58
	Calculation of Crystallite Size	16:01
	The wavelength of electron	18:16
	Electron diffraction using Transmission electron microscopy	14:18
	Electron diffraction of real materials	12:02
	Electron diffraction vs. X-ray diffraction	11:46

Section 8

	Study of the surface chemistry of material using electron spectroscopy	18:55
	X-ray photoelectron emission	11:43
	X-ray photoelectron spectroscopy (XPS)	09:28
	X-ray monochromator	17:36
	X-ray photoelectron spectrometer	11:22
	How to get the binding energy?	09:15
	Which questions XPS can answer?	14:51
	Spin-orbit splitting of XPS peaks	11:51
	Elemental shift of XPS peaks	16:48
	A real XPS analysis	11:57
	Study of the surface chemistry of material by using Auger electrons	13:42
	Kinetic energy of Auger electrons	15:59
	Auger electron spectrometer 1	12:12
	Auger electron spectrometer 2	13:04
	Auger electron spectroscopy	15:41
	Auger electrons vs XPS spectra	09:04