The use of electron beam for imaging application
Category General
Difficulty Level Normal
Audience Level General
Description Microscopic characterization methods refer to scientific techniques Which allow determination of both composition and structure of a material. Optical microscopy, scanning probe microscopy and electron microscopy are known as microscopic techniques. This course illustrates how microscopic characterization techniques are used.
Difficulty Level Normal
Audience Level General
Description Microscopic characterization methods refer to scientific techniques Which allow determination of both composition and structure of a material. Optical microscopy, scanning probe microscopy and electron microscopy are known as microscopic techniques. This course illustrates how microscopic characterization techniques are used.
Overview
Microscopic methods play an essential role in nanomaterials characterization. Microscopic and X-ray based characterization of nanomaterials techniques are used for the determination of surface morphology and dispersion characteristics of nanomaterials. This course deals with details of these aspects, and will provide a fundamental understanding of morphological tools, such as instrumentation, sample preparation and different kinds of analyses, etc.
Booklet
Microscopic methods play an essential role in nanomaterials characterization. Microscopic and X-ray based characterization of nanomaterials techniques are used for the determination of surface morphology and dispersion characteristics of nanomaterials. This course deals with details of these aspects, and will provide a fundamental understanding of morphological tools, such as instrumentation, sample preparation and different kinds of analyses, etc.
Booklet
Description |
This lesson describes how electron beam radiation made a huge revolution in microscope technology. As mentioned, it has taken so many years for the researchers to discover the two sided nature of the electron which is known as the Wave-Particle Duality. Using this behavior, scientists has found that imaging of the fine particle in nano dimension is possible only if the velocity and the wavelength of an electron increases and decreases to the required extent, respectively. Hence, electron microscopes can give us a magnification of about a million times or more and a resolution of less than one nanometer, which is the best tool for observing the nanoparticles. |
Mental Challenge |
Why X-ray beam or ultra-violate light are not suitable for imaging nanoparticles? |
Quizzes and Activities |
Activity: Based on the information given in this section can you mention other application of electron beam radiation? |
Further Reading Sources |
1. http://ne.phys.kyushu-u.ac.jp/seminar/MicroWorld1_E/Part4_E/P44_E/wave_character_of_electron_E.htm |
| Imaging of the materials | 06:46 | |
| Optical microscope | 12:22 | |
| The use of electron beam for imaging application | 09:11 | |
| The basic functions of imaging with electron beam 01 | 14:17 | |
| The basic functions of imaging with electron beam 02 | 13:24 | |
| Interaction of electron beam with sample | 15:54 |
| Atomic Force Microscope (AFM) | 11:42 | |
| Imaging using atomic force | 10:41 | |
| Advantages and disadvantages of AFM microscope | 12:49 | |
| Semi-contact (tapping) mode | 11:01 | |
| Non-contact Mode | 17:26 | |
| MFM | 11:14 |