A real XPS analysis

Microscopic Characterization
Category General
Difficulty Level Normal
Audience Level General
Description Microscopic characterization methods refer to scientific techniques Which allow determination of both composition and structure of a material. Optical microscopy, scanning probe microscopy and electron microscopy are known as microscopic techniques. This course illustrates how microscopic characterization techniques are used.
Overview
Microscopic methods play an essential role in nanomaterials characterization. Microscopic and X-ray based characterization of nanomaterials techniques are used for the determination of surface morphology and dispersion characteristics of nanomaterials. This course deals with details of these aspects, and will provide a fundamental understanding of morphological tools, such as instrumentation, sample preparation and different kinds of analyses, etc.


Booklet
Description
 X-ray photoelectron spectroscopy (XPS) is quantitative in nature, however the core level spectra of carbon tends to become heavily convoluted by multiple oxidation states. It often demonstrates non-ideal behavior for both poorly conducting samples and highly conductive samples, complicating analyses. A depth profile of a sample in terms of XPS quantities can be obtained by combining a sequence of ion gun etch cycles interleaved with XPS measurements from the current surface.
Mental Challenge
 How does deconvolution of XPS peaks do (X ray Photoelectron spectra)? 
Quizzes and Activities
 Activity: Which two elements cannot be recognized with XPS? Describe this issue with an example.
Further Reading Sources

1.http://www.casaxps.com/help_manual/manual_updates/Depth_Profiling_using_XPS.pdf

2.https://www.sciencedirect.com/science/article/pii/S0008622316307631

Section 1

Section 2

Section 3

Section 4

Section 5

Section 6

Section 7

Section 8